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Volumn 29, Issue 7, 2008, Pages 85-88

Fatigue life prediction of SnAgCu soldered joints of FCBGA device

Author keywords

Constistutive equation; Fatigue life; Underfill

Indexed keywords

COPPER; FATIGUE OF MATERIALS; SOLDERED JOINTS; STRESS CONCENTRATION;

EID: 50049117285     PISSN: 0253360X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (10)

References (12)
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    • Effect of size of lid-substrate adhesive on reliability of solder balls in thermally enhanced flip chip PBGA packages
    • Jen Y M, Fang C K, Yeh Y H. Effect of size of lid-substrate adhesive on reliability of solder balls in thermally enhanced flip chip PBGA packages[J]. IEEE Transactions on Components and Packaging Technologies, 2006, 29(4): 718-726.
    • (2006) IEEE Transactions on Components and Packaging Technologies , vol.29 , Issue.4 , pp. 718-726
    • Jen, Y.M.1    Fang, C.K.2    Yeh, Y.H.3
  • 2
    • 50049088441 scopus 로고    scopus 로고
    • Chinese source
  • 4
    • 13944261675 scopus 로고    scopus 로고
    • Effect of underfill thermomechanical properties on thermal cycling fatigue reliability of flip-chip ball grid array
    • Wang T H, Lai Y S, Wu J D. Effect of underfill thermomechanical properties on thermal cycling fatigue reliability of flip-chip ball grid array[J]. Journal of Electronic Packaging, 2004, 126(4): 560-564.
    • (2004) Journal of Electronic Packaging , vol.126 , Issue.4 , pp. 560-564
    • Wang, T.H.1    Lai, Y.S.2    Wu, J.D.3
  • 5
    • 0033723929 scopus 로고    scopus 로고
    • Effects of underfill material properties on the reliability of solder bumped flip chip on board with imperfect underfill encapsulants
    • Lau J H, Lee R S W, Chang C. Effects of underfill material properties on the reliability of solder bumped flip chip on board with imperfect underfill encapsulants[J]. IEEE Transactions on Components and Packaging Technologies, 2000, 23(2): 323-333.
    • (2000) IEEE Transactions on Components and Packaging Technologies , vol.23 , Issue.2 , pp. 323-333
    • Lau, J.H.1    Lee, R.S.W.2    Chang, C.3
  • 6
    • 50049129853 scopus 로고    scopus 로고
    • Chinese source
  • 7
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    • Chinese source
  • 9
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    • Applying Anand model to represent the viscoplastic deformation behavior solder alloys
    • Wang G Z, Cheng Z N, Becker K, et al. Applying Anand model to represent the viscoplastic deformation behavior solder alloys[J]. Journal of Electronic Packaging, 2001, 123(3): 127-253.
    • (2001) Journal of Electronic Packaging , vol.123 , Issue.3 , pp. 127-253
    • Wang, G.Z.1    Cheng, Z.N.2    Becker, K.3
  • 10
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    • Finite element modeling predicts the effects of voids on thermal shock reliability and thermal resistance of power device
    • Chang B J, Wang L, Dirk J, et al. Finite element modeling predicts the effects of voids on thermal shock reliability and thermal resistance of power device[J]. Welding Journal, 2006, 85(S): 63-70.
    • (2006) Welding Journal , vol.85 , Issue.S , pp. 63-70
    • Chang, B.J.1    Wang, L.2    Dirk, J.3
  • 11
    • 50049102341 scopus 로고    scopus 로고
    • Chinese source
  • 12
    • 33748938357 scopus 로고    scopus 로고
    • Board level solder joint reliability analysis of stacked die mixed flip-chip and wirebond BGA
    • Tee T Y, Ng H S, Zhong Z W. Board level solder joint reliability analysis of stacked die mixed flip-chip and wirebond BGA[J]. Microelectronics and Reliability, 2006, 46(12): 2131-2138.
    • (2006) Microelectronics and Reliability , vol.46 , Issue.12 , pp. 2131-2138
    • Tee, T.Y.1    Ng, H.S.2    Zhong, Z.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.