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Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 4, Issue 7, 2007, Pages 2666-2669

Analysis of buffer-related lag phenomena and current collapse in GaN FETs

(3) Itagaki, K a Kobayashi, N a Horio, K a

a SHIBAURA INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT COLLAPSE; CURRENT SLUMP; DRAIN VOLTAGES; GA TE LENGTHS; GATE VOLTAGES; I-V CURVES; NITRIDE SEMICONDUCTORS; SEMI-INSULATING BUFFER;

CRYSTALS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT MEASUREMENT; ELECTRIC CURRENTS; GALLIUM ALLOYS; GALLIUM NITRIDE; MESFET DEVICES; NITRIDES; SEMICONDUCTING GALLIUM; SEMICONDUCTOR MATERIALS;

DRAIN CURRENT;

EID: 49749145254 PISSN: 18626351 EISSN: None Source Type: Journal
DOI: 10.1002/pssc.200674715 Document Type: Conference Paper

Times cited : (9)

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