Photoluminescence emission profiles of y2O3: Eu films composed of high-low density stacks produced by glancing angle deposition

Applied Optics

Volumn 47, Issue 15, 2008, Pages 2798-2805

  Gospodyn, James ^a   Taschuk, Michael T ^a   Hrudey, Peter C P ^a,b   Tsui, Ying Y ^a   Fedosejevs, Robert ^a   Brett, Michael J ^a,c   Sit, Jeremy C ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^c NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DISTRIBUTION; DEPOSITION; EUROPIUM; FUSED SILICA; SUBSTRATES;

ANGULAR EMISSION; ELLIPSOMETRY MEASUREMENTS; FUSED SILICA SUBSTRATES; GLANCING ANGLE DEPOSITION; OBSERVATION ANGLE; PHOTOLUMINESCENCE EMISSION; PHOTOLUMINESCENCE SPECTRUM; POST DEPOSITION ANNEALING;

PHOTOLUMINESCENCE;

EID: 49749136542     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.002798     Document Type: Article

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