Effects of film structure on photoluminescent emission properties of nanostructured Y2O3: Eu thin films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5510, Issue , 2004, Pages 78-87

  Hrudey, Peter C P ^a   Taschuk, Michael ^a   Tsui, Ying Y ^a   Fedosejevs, Robert ^a   Brett, Michael J ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Glancing Angle Deposition; Photoluminescence; Polarized photoluminescence; PVD; Thin films

Indexed keywords

ANISOTROPY; EUROPIUM; LIGHT EMITTING DIODES; LIGHT POLARIZATION; MICROELECTRONICS; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; PHYSICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

BRIGHTNESS; GLANCING ANGLE DEPOSITION (GLAD); POLARIZED PHOTOLUMINESCENCE; SELF-SHADOWING EFFECTS;

THIN FILMS;

EID: 13244269796     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.559957     Document Type: Conference Paper

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