Reliability-aware optimization for DVS-enabled real-time embedded systems

Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008

Volumn , Issue , 2008, Pages 780-783

  Dabiri, Foad ^a   Amini, Naivd ^a   Rofouei, Mahsan ^a   Sarrafzadeh, Majid ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL SYSTEMS; CONVEX PROGRAMMING; DYNAMIC VOLTAGE SCHEDULING; ELECTRONIC DESIGNS; ENERGY CONSUMPTION; ENERGY OPTIMIZATIONS; FEATURE SIZES; INTERNATIONAL SYMPOSIUM; LOW POWERS; OPTIMAL RESULTS; REAL-TIME EMBEDDED SYSTEMS; SAVE ENERGY; SINGLE-EVENT UPSETS; SOFT ERROR RATES; SOFT ERRORS; SUPPLY VOLTAGES; TASK GRAPHS; TECHNIQUES USED;

BENCHMARKING; DIGITAL CIRCUITS; DIGITAL INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS; ELECTRONICS ENGINEERING; ENERGY CONSERVATION; ENERGY POLICY; ERROR ANALYSIS; ERROR CORRECTION; INTEGRATED CIRCUITS; LEARNING SYSTEMS; LOGIC DEVICES; MICROPROCESSOR CHIPS; OPTIMIZATION; REAL TIME SYSTEMS; URANIUM POWDER METALLURGY; VOLTAGE STABILIZING CIRCUITS;

EMBEDDED SYSTEMS;

EID: 49749119546     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2008.4479837     Document Type: Conference Paper

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