|
Volumn 310, Issue 17, 2008, Pages 3973-3978
|
Boron phosphide as the buffer-layer for the epitaxial III-nitride growth: A theoretical study
|
Author keywords
A1. Adsorption; A1. Surface structure; A3. Atomic layer epitaxy; B1. Nitrides
|
Indexed keywords
ADSORPTION;
ATOMIC PHYSICS;
ATOMS;
BACKPROPAGATION;
BORON;
BORON NITRIDE;
DIMERS;
EPITAXIAL GROWTH;
GALLIUM ALLOYS;
GALLIUM NITRIDE;
NITRIDES;
NONMETALS;
OLIGOMERS;
SEMICONDUCTING GALLIUM;
THICK FILMS;
A1. ADSORPTION;
A1. SURFACE STRUCTURE;
A3. ATOMIC LAYER EPITAXY;
B1. NITRIDES;
BEFORE AND AFTER;
BOND ANGLES;
BOND LENGTHS;
BORON PHOSPHIDE;
BUFFER LAYERS;
GAN FILMS;
GAN THIN FILMS;
III NITRIDES;
SURFACE DIMERS;
TERMINATED SURFACES;
MOLECULAR BEAM EPITAXY;
|
EID: 49449085789
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2008.06.039 Document Type: Article |
Times cited : (29)
|
References (25)
|