Theoretical and numerical analysis of lateral resolution improvement characteristics for fluorescence microscopy using standing evanescent light with image retrieval

Measurement Science and Technology

Volumn 19, Issue 8, 2008, Pages

  Takahashi, S ^a   Okada, S ^a   Nishioka, H ^a   Usuki, S ^a   Takamasu, K ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Evanescent light; Fluorescence microscopy; Lateral resolution improvement; Rayleigh criterion; TIRF microscopy

Indexed keywords

APPROXIMATION ALGORITHMS; DIFFRACTION; FLUORESCENCE; FLUORESCENCE MICROSCOPY; IMAGE RETRIEVAL; NUMERICAL METHODS; RAYLEIGH SCATTERING; REFRACTIVE INDEX;

EVANESCENT LIGHT; ILLUMINATION DISTRIBUTION; LATERAL RESOLUTION IMPROVEMENT; RAYLEIGH CRITERION; STRUCTURED ILLUMINATION; SUCCESSIVE APPROXIMATIONS; TIRF MICROSCOPY; TOTAL INTERNAL REFLECTION FLUORESCENCE;

LIGHT;

EID: 48849106813     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/19/8/084006     Document Type: Article

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