Method for the improvement of lateral resolution in stimulated emission depletion microscopy using a pupil filter

Measurement Science and Technology

Volumn 18, Issue 8, 2007, Pages

  Yoo, Hongki ^a   Song, Incheon ^a   Kim, Taehoon ^a   Gweon, Dae Gab ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Confocal microscopy; Fluorescence microscopy; High resolution; Point spread function; Pupil filter; STED microscopy

Indexed keywords

CONFOCAL MICROSCOPY; FLUORESCENCE MICROSCOPY; NUMERICAL METHODS; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION;

COATED PHASE PLATE; LATERAL RESOLUTION; PUPIL FILTER; STED MICROSCOPY;

STIMULATED EMISSION;

CONFOCAL MICROSCOPY; FLUORESCENCE MICROSCOPY; NUMERICAL METHODS; OPTICAL RESOLVING POWER; OPTICAL TRANSFER FUNCTION; STIMULATED EMISSION;

EID: 34547456524     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/8/N01     Document Type: Article

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