|
Volumn 94, Issue 5, 2005, Pages
|
Far-field optical microscopy with a nanometer-scale resolution based on the in-plane image magnification by surface plasmon polaritons
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DISPERSION LAWS;
FAR-FIELD OPTICAL MICROSCOPY;
IN-PLANE IMAGE MAGNIFICATION;
SURFACE PLASMON POLARITONS (SPP);
DIELECTRIC MATERIALS;
DIFFRACTION;
GOLD;
OPTICAL PROPERTIES;
PERMITTIVITY;
REFRACTIVE INDEX;
SURFACE ROUGHNESS;
THIN FILMS;
OPTICAL MICROSCOPY;
|
EID: 18144395789
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.94.057401 Document Type: Article |
Times cited : (186)
|
References (15)
|