TEM characterization of Ge precipitates in an Al-1.6 at% Ge alloy

Ultramicroscopy

Volumn 108, Issue 3, 2008, Pages 210-220

  Kaneko, K ^a   Inoke, K ^b   Sato, K ^a   Kitawaki, K ^a   Higashida, H ^a   Arslan, I ^c   Midgley, P A ^c  

^a KYUSHU UNIVERSITY   (Japan)

^b Thermo Fisher Scientific   (United States)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Aluminum alloy; Electron tomography; High resolution TEM; In situ TEM

Indexed keywords

GERMANIUM; SURFACE DIFFUSION; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

ANISOTROPIC GROWTH; ELECTRON TOMOGRAPHY; VACANCY CONCENTRATION;

ALUMINUM ALLOYS;

ALLOY; ALUMINUM; GERMANIUM;

ARTICLE; IMAGE ANALYSIS; IMAGING SYSTEM; PRECIPITATION; THREE DIMENSIONAL IMAGING; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 38349103728     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.04.020     Document Type: Article

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