Crack tip dislocations in silicon characterized by high-voltage electron microscopy

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 82, Issue 17-18, 2002, Pages 3263-3273

  Higashida, K ^a   Narita, N ^b   Tanaka, M ^a   Morikawa, T ^a   Miura, Y ^a   Onodera, R ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRACKS; DISLOCATIONS (CRYSTALS); ELECTRON MICROSCOPY; VICKERS HARDNESS TESTING;

SILICON CRYSTALS;

SILICON;

EID: 0037146409     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610208240439     Document Type: Article

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