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Volumn 43, Issue 9, 2002, Pages 2169-2172
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HVEM/AFM observation of hinge-type plastic zones associated with cracks in silicon crystals
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Author keywords
Atomic force microscopy; Brittle to ductile transition; Crack; Dislocation; Fracture; High voltage electron microscopy; Silicon single crystal; Transmission electron microscopy
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRACKS;
DISLOCATIONS (CRYSTALS);
FRACTURE TOUGHNESS;
INDENTATION;
PLASTICS;
RESIDUAL STRESSES;
SINGLE CRYSTALS;
HINGE-TYPE PLASTIC ZONES;
SILICON;
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EID: 0036761590
PISSN: 13459678
EISSN: None
Source Type: Journal
DOI: 10.2320/matertrans.43.2169 Document Type: Article |
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Times cited : (15)
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References (8)
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