Microstructure of plastic zones around crack tips in silicon revealed by HVEM and AFM

Materials Science and Engineering: A

Volumn 387-389, Issue 1-2 SPEC. ISS., 2004, Pages 433-437

  Tanaka, Masaki ^a   Higashida, Kenji ^a   Haraguchi, Tomoko ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

Brittle to ductile transition; Dislocation structure; Electron microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; BRITTLENESS; CRACK INITIATION; CRYSTALS; DUCTILITY; ELECTRON MICROSCOPY; MICROSTRUCTURE; SILICON; THERMAL EFFECTS; VICKERS HARDNESS TESTING;

CRACK TIPS; HIGH-VOLTAGE ELECTRON MICROSCOPY (HVEM); PLASTIC ZONES; SLIP BANDS;

PLASTICS;

MICROSTRUCTURE;

EID: 10644261184     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2004.05.040     Document Type: Article

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