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Volumn , Issue , 2007, Pages 278-282
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Improved first-order parameterized statistical timing analysis for handling slew and capacitance variation
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER PROGRAMMING LANGUAGES;
EMBEDDED SYSTEMS;
INTEGRATED CIRCUITS;
PROBABILITY;
PROBABILITY DISTRIBUTIONS;
SENSITIVITY ANALYSIS;
SYSTEMS ANALYSIS;
TIME MEASUREMENT;
TIMING DEVICES;
ANALYTICAL EXPRESSIONS;
CAPACITANCE VARIATIONS;
CASE ANALYSIS;
FIRST ORDERS;
INHERENT EFFECTS;
OUTPUT LOADS;
PARAMETERIZED;
PATH ARRIVALS;
POINTS OF INTERESTS;
POPULAR TECHNIQUES;
PROCESS PARAMETER VARIATIONS;
PROCESS PARAMETERS;
PROCESS VARIATIONS;
SHRINKING PROCESSES;
STATIC TIMING ANALYSES;
STATISTICAL TIMING ANALYSES;
TIMING ANALYSIS;
VARIATIONS OF;
TIMING CIRCUITS;
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EID: 48349102062
PISSN: 10639667
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/VLSID.2007.92 Document Type: Conference Paper |
Times cited : (9)
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References (16)
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