Scanning optical probe microscopy with submicrometer resolution using an organic photodetector

Applied Physics Letters

Volumn 93, Issue 3, 2008, Pages

  An, Kwang H ^a   O'Connor, Brendan ^a   Pipe, Kevin P ^a   Zhao, Yiying ^a   Shtein, Max ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BIOLOGICAL MATERIALS; DATA RECORDING; FLUORESCENCE MICROSCOPY; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; NONMETALS; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; OPTICAL MICROSCOPY; OPTICAL RECORDING; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS; OPTOELECTRONIC DEVICES; PHOTODETECTORS; SCANNING; SCANNING PROBE MICROSCOPY; SILICON; SULFATE MINERALS;

AMERICAN INSTITUTE OF PHYSICS (AIP); ATOMIC FORCE (AF); BIOLOGICAL SAMPLES; HIGH RESOLUTIONS; NEAR-FIELD SCANNING OPTICAL MICROSCOPY (NSOM); OPTICAL (PET) (OPET); OPTOELECTRONIC MATERIALS; POTENTIAL APPLICATIONS; SCANNING OPTICAL; SCANNING PROBES; SILICON-BASED; SUB MICROMETER RESOLUTION; TOPOGRAPHIC DATA;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 48249125478     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2963033     Document Type: Article

References (17)

1. E. Betzig and J. Trautman, Science 257, 189 (1992).
2. B. Hecht, B. Sick, U. Wild, V. Deckert, R. Zenobi, O. Martin, and D. Pohl, J. Chem. Phys. 112, 7761 (2000).
3. A. Larosa, B. Yakobson, and H. Hallen, Appl. Phys. Lett. 67, 2597 (1995).
4. M. Stahelin, M. Bopp, G. Tarrach, A. J. Meixner, and I. Zschokkegranacher, Appl. Phys. Lett. 68, 2603 (1996).
5. R. Bachelot, P. Gleyzes, and A. Boccara, Appl. Opt. 36, 2160 (1997).
6. B. Hecht, H. Bielefeldt, Y. Inouye, D. Pohl, and L. Novotny, J. Appl. Phys. 81, 2492 (1997).
7. Y. Inouye and S. Kawata, Opt. Lett. 19, 159 (1994).
8. S. Heisig, O. Rudow, and E. Oesterschulze, Appl. Phys. Lett. 77, 1071 (2000).
9. P. Burrows, Y. Zhang, E. Haskal, and S. Forrest, Appl. Phys. Lett. 61, 2417 (1992).
10. H. Kroemer, J. Cryst. Growth 81, 193 (1987).
11. R. Davis, C. Williams, and P. Neuzil, Opt. Lett. 21, 447 (1996).
12. K. Hoshino, L. Rozanski, D. A. V. Bout, and X. J. Zhang, Appl. Phys. Lett. 92, 131106 (2008).
13. K. An, B. O'Connor, K. Pipe, Y. Zhao, and M. Shtein, Appl. Phys. Lett. 89, 111117 (2006).
14. Y. Y. Zhao, K. An, S. Chen, B. O'Connor, K. Pipe, and M. Shtein, Nano Lett. 7, 3645 (2007).
15. P. Peumans and S. Forrest, Appl. Phys. Lett. 79, 126 (2001).
16. P. Grabiec, J. Radojewski, M. Zaborowski, K. Domanski, T. Schenkel, and I. Rangelow, J. Vac. Sci. Technol. B 22, 16 (2004).
17. J. Lupton, R. Koeppe, J. Muller, J. Feldmann, U. Scherf, and U. Lemmer, Adv. Mater. (Weinheim, Ger.) 15, 1471 (2003).