Optical intensity mapping on the nanometer scale by near-field photodetection optical microscopy

Optics Letters

Volumn 21, Issue 7, 1996, Pages 447-449

  Davis, R C ^a   Williams, C C ^a   Neuzil, P ^b  

^a UNIVERSITY OF UTAH   (United States)

^b UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001603802     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.000447     Document Type: Article

References (12)

1. E. Betzig and J. K. Trautman, Science 257, 189 (1992).
2. H. F. Hess, E. Betzig, T. D. Harris, L. N. Pfeiffer, and K. W. West, Science 264, 1740 (1994).
3. J. K. Trautman, J. J. Macklin, L. E. Brus, and E. Betzig, Nature (London) 369, 40 (1994).
4. F. Zenhausen, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 65, 1623 (1994).
5. D. R. Busath, R. C. Davis, and C. C. Williams, Proc. SPIE 1855, 75 (1993).
6. H. U. Danzebrink and U. C. Fischer, in Near Field Optics, D. W. Pohl and D. Courjon, eds. (Kluwer, Dordrecht, The Netherlands, 1993), pp. 303-308.
7. D. R. Busath, "Near-field photodetection probe for near-field optical microscopy," M. S. thesis (University of Utah, Salt Lake City, Utah, 1994).
8. H.-U. Danzebrink, J. Microsc. 167, 276 (1994).
9. R. C. Davis, C. C. Williams, and P. Neuzil, Appl. Phys. Lett. 66, 2309 (1995).
10. G. Kolb, K. Karrai, and G. Abstreiter, Appl. Phys. Lett. 65, 3090 (1994).
11. K. Lieberman and A. Lewis, Appl. Phys. Lett. 62, 1335 (1993).
12. C. C. Williams and H. K. Wickramasinghe, Appl. Phys. Lett. 49, 1587 (1986).