Explanation and correction of false step heights in amplitude modulation atomic force microscopy measurements on alkane films

Ultramicroscopy

Volumn 108, Issue 9, 2008, Pages 946-952

  Bai, M ^a   Trogisch, S ^a   Magonov, S ^b   Taub, H ^a  

^a UNIVERSITY OF MISSOURI   (United States)

^b AGILENT TECHNOLOGIES   (United States)

Author keywords

Contact AFM; Non contact AFM; Self assembled monolayers

Indexed keywords

ATOMIC FORCE MICROSCOPY; MICROSCOPIC EXAMINATION; MODULATION; PARAFFINS; SCANNING PROBE MICROSCOPY;

(P ,P ,T) MEASUREMENTS; ALKANE FILMS; ATOMIC FORCE (AF); FALSE STEP;

HYDROCARBONS;

ALKANE DERIVATIVE;

AMPLITUDE MODULATION; ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; MEASUREMENT; OSCILLATION; X RAY ANALYSIS;

EID: 48149104803     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.03.009     Document Type: Article

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