Atomic force microscopy measurements of topography and friction on dotriacontane films adsorbed on a SiO 2 surface

Journal of Chemical Physics

Volumn 123, Issue 15, 2005, Pages

  Trogisch, S ^a   Simpson, M J ^a   Taub, H ^a   Volkmann, U G ^b   Pino, M ^b   Hansen, F Y ^c  

^a UNIVERSITY OF MISSOURI   (United States)

^b PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE   (Chile)

^c TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

LATERAL FRICTION; MULTILAYER STRUCTURES; X-RAY SPECULAR REFLECTIVITY;

ADSORPTION; ATOMIC FORCE MICROSCOPY; FRICTION; SILICA; SURFACE TOPOGRAPHY;

THIN FILMS;

EID: 28344438232     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2060707     Document Type: Article

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