Estimating the integral non-linearity of AD-converters via the frequency domain

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 757-762

  Csizmadia, Nico ^a   Janssen, A J E M ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; ELECTRIC DISTORTION; FAST FOURIER TRANSFORMS; HARMONIC GENERATION; PROBABILITY DENSITY FUNCTION; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE; TRANSFER FUNCTIONS;

AUTOMATED TEST EQUIPMENT; DIFFERENTIAL NONLINEARITY; FOURIER COEFFICIENTS; INTEGRAL NONLINEARITY; SIGNAL TO NOISE AND DISTORTION; TOTAL HARMONIC DISTORTION; WOBBLING METHOD;

INTEGRATED CIRCUIT TESTING;

EID: 0033353554     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)