Simplified polynomial-fitting algorithm for DAC and ADC BIST

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 389-395

  Sunter, Stephen K ^a   Nagi, Naveena ^a  

^a LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ANALOG TO DIGITAL CONVERSION; DIGITAL TO ANALOG CONVERSION; POLYNOMIALS;

BUILT IN SELF TEST (BIST); SIGMA DELTA MODULATORS;

INTEGRATED CIRCUIT TESTING;

EID: 0031357811     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)