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Volumn 3, Issue , 1999, Pages 1498-1503
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Overview of IEEE-STD-1241: `Standard for terminology and test methods for analog-to-digital converters'
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONIC EQUIPMENT TESTING;
MEASUREMENT ERRORS;
STANDARDIZATION;
STANDARDS;
INTERNATIONAL STANDARDS;
ANALOG TO DIGITAL CONVERSION;
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EID: 0032655472
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (28)
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References (3)
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