Threshold defect production in silicon determined by density functional theory molecular dynamics simulations

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 4, 2008, Pages

  Holmstrom E ^a   Kuronen, A ^a   Nordlund, K ^a  

^a UNIVERSITY OF HELSINKI   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 47349092945     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.045202     Document Type: Article

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