Neural network approximation of tip-abrasion effects in AFM imaging

Measurement Science and Technology

Volumn 19, Issue 6, 2008, Pages

  Bakucz, Peter ^a   Yacoot, Andrew ^b   Dziomba, Thorsten ^a   Koenders, Ludger ^a   Krüger Sehm, Rolf ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Nanometrology; Neural networks; Scanning probe microscope; Tip abrasion

Indexed keywords

ABRASION; MAPPING; NETWORK LAYERS; NEURAL NETWORKS; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; TRIBOLOGY; VECTOR SPACES;

HIDDEN LAYER NETWORKS; MEASUREMENT QUALITY; MEASUREMENTS OF; NANOMETROLOGY; NEURAL NETWORK APPROXIMATION; NONLINEAR MAPPINGS; REGRESSION VECTORS; TIP ABRASION;

FEEDFORWARD NEURAL NETWORKS;

EID: 46749099831     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/19/6/065101     Document Type: Article

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