Subpixel microscopic deformation analysis using correlation and artificial neural networks

Optics Express

Volumn 8, Issue 6, 2001, Pages 322-327

  Pitter, Mark C ^a   See, Chung W ^a   Somekh, Michael G ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; DEFORMATION; FUNCTIONS; IMAGE PROCESSING; MICROELECTRONICS; THERMAL STRESS;

IMAGE CORRELATION; PIXEL ACCURACY; PIXEL SHIFTING; SUBPIXELS;

NEURAL NETWORKS;

EID: 0038925218     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.8.000322     Document Type: Conference Paper

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