Modeling single-event upsets in 65-nm silicon-on-insulator semiconductor devices

IEEE Transactions on Nuclear Science

Volumn 53, Issue 6, 2006, Pages 3321-3328

  KleinOsowski, A J ^a   Oldiges, Phil ^b   Williams, Richard Q ^b   Solomon, Paul M ^c  

^a IBM AUSTIN RESEARCH LABORATORY   (United States)

^b IBM   (United States)

^c IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Alpha particle; Modeling; Radiation event; Single event upset; Soft error

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; MOSFET DEVICES; RADIATION EFFECTS;

ALPHA PARTICLE; CIRCUIT MODELING; SINGLE EVENT UPSETS (SET); SOFT ERROR;

SILICON ON INSULATOR TECHNOLOGY;

EID: 33846289912     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.884353     Document Type: Conference Paper

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