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Volumn 573-574, Issue , 2008, Pages 237-256

Laser annealing of implanted semiconductor layers - One bridge to nano-processing

Author keywords

Electrical activation; Heat dissipation; Heat pulses; Heating regime; Laser annealing; Silicon; Thermally activated process; Thermostress

Indexed keywords

ANNEALING; CHEMICAL ACTIVATION; HEAT LOSSES; PROCESS CONTROL; RAPID THERMAL PROCESSING; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON;

EID: 45749084905     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.573-574.237     Document Type: Article
Times cited : (1)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.