|
Volumn 464-465, Issue , 2004, Pages 170-174
|
Finding a promising precursor for chemical vapor deposition of carbon nitride thin films
a
SAGA UNIVERSITY
(Japan)
|
Author keywords
Chemical vapor deposition (CVD); Nitrides; X ray diffraction; X ray photoelectron spectroscopy
|
Indexed keywords
CARBON NITRIDE;
CRYSTAL STRUCTURE;
DEPOSITION;
ELASTIC MODULI;
FILM GROWTH;
HARDNESS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
PYROMETERS;
X RAY DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
BONDING STRUCTURES;
OPTICAL PYROMETERS;
STAINLESS STEEL FLANGES;
THIN FILMS;
|
EID: 4544315731
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2004.06.076 Document Type: Article |
Times cited : (8)
|
References (15)
|