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Volumn 464-465, Issue , 2004, Pages 170-174

Finding a promising precursor for chemical vapor deposition of carbon nitride thin films

Author keywords

Chemical vapor deposition (CVD); Nitrides; X ray diffraction; X ray photoelectron spectroscopy

Indexed keywords

CARBON NITRIDE; CRYSTAL STRUCTURE; DEPOSITION; ELASTIC MODULI; FILM GROWTH; HARDNESS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; PYROMETERS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 4544315731     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.06.076     Document Type: Article
Times cited : (8)

References (15)
  • 1
    • 20444373328 scopus 로고
    • Liu A.Y., Cohen M.L. Science. 245:1989;841 Phys. Rev., B. 41:1990;10727.
    • (1989) Science , vol.245 , pp. 841
    • Liu, A.Y.1    Cohen, M.L.2
  • 2
    • 0042059097 scopus 로고
    • Liu A.Y., Cohen M.L. Science. 245:1989;841 Phys. Rev., B. 41:1990;10727.
    • (1990) Phys. Rev., B , vol.41 , pp. 10727


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.