Investigations of MBE grown InN and the influence of sputtering on the surface composition

Surface Science

Volumn 566-568, Issue 1-3 PART 2, 2004, Pages 849-855

  Krischok, S ^a   Yanev, V ^a   Balykov, O ^a   Himmerlich, M ^a   Schaefer, J A ^a   Kosiba, R ^a   Ecke, G ^a   Cimalla, I ^a   Cimalla, V ^a   Ambacher, O ^a   Lu, H ^b   Schaff, W J ^b   Eastman, L F ^b  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b Cornell University   (United States)

Author keywords

Auger electron spectroscopy; Electron energy loss spectroscopy (EELS); Molecular beam epitaxy; Nitrides; Photoelectron spectroscopy

Indexed keywords

ADSORPTION; AUGER ELECTRON SPECTROSCOPY; BINDING ENERGY; ELECTRON ENERGY LOSS SPECTROSCOPY; ION BOMBARDMENT; KINETIC ENERGY; MOLECULAR BEAM EPITAXY; NITROGEN; OXIDATION; PHOTONS; SPUTTERING; SURFACE STRUCTURE; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER SPECTROMETERS; PHOTOTHERMAL DEFLECTION SPECTROSCOPY (PDS); PREFERENTIAL SPUTTERING; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;

INDIUM COMPOUNDS;

EID: 4544286332     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.06.020     Document Type: Article

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