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Volumn 234, Issue 3, 2002, Pages 801-804

Structure analysis of InN film using extended X-ray absorption fine structure method

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0036930564     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200212)234:3<801::AID-PSSB801>3.0.CO;2-W     Document Type: Conference Paper
Times cited : (39)

References (12)
  • 9
    • 0003643060 scopus 로고
    • Eds. H. Winick, D. Xian, M. Ye, and T. Huang, Gordon & Breach, New York
    • F.W. Lytle, in: Application of Synchrotron Radiation, Eds. H. Winick, D. Xian, M. Ye, and T. Huang, Gordon & Breach, New York 1988.
    • (1988) Application of Synchrotron Radiation
    • Lytle, F.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.