Structural and optical properties of porous nanocrystalline Ge

Journal of Applied Physics

Volumn 103, Issue 11, 2008, Pages

  Kartopu, G ^a,d   Sapelkin, A V ^b   Karavanskii, V A ^c   Serincan, U ^d,e   Turan, R ^d  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

^c RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^d MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

^e ANADOLU UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHARGED PARTICLES; CHEMICAL PROPERTIES; CURVE FITTING; DIAMOND FILMS; DIAMONDS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRON OPTICS; ELECTRONS; GERMANIUM; HYDROGEN; IMAGING TECHNIQUES; INFRARED SPECTROSCOPY; LIGHT EMISSION; LUMINESCENCE; MICROSCOPIC EXAMINATION; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLINE MATERIALS; NANOSTRUCTURED MATERIALS; OPTICAL MATERIALS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; SEMICONDUCTING CADMIUM TELLURIDE; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; STRUCTURAL PROPERTIES; SURFACES; TRANSIENT ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

(1 1 0) SURFACE; (PL) PROPERTIES; AMERICAN INSTITUTE OF PHYSICS (AIP); AVERAGE SIZE; CHEMICAL ETCHING; CONFINEMENT MODELS; DISORDERED SURFACES; ELECTRON MICROSCOPY (TEM AND SEM); GE FILMS; HIGH-DENSITY; INFRARED (IR); NANO CRYSTALLINE; OPTICAL (PET) (OPET); OPTICAL GAPS; PEAK ENERGIES; PHOTOLUMINESCENCE (PL); RAMAN SPECTRUM; ROOM-TEMPERATURE (RT); SINGLE-CRYSTALLINE; SPHERICAL(PIVOT); THEORETICAL CALCULATIONS;

INTEGRATED OPTOELECTRONICS;

EID: 45149127557     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2924417     Document Type: Article

References (39)

1. V. Lehmann and U. Gösele, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.104512 58, 856 (1991).
2. L. Canham, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.103561 57, 1046 (1990).
3. See, for example, A. G. Cullis, L. T. Canham, and P. D. J. Calcott, J. Appl. Phys. 82, 909 (1997), and references therein 0003-6951; J. Linnros, F. Priolo, and L. Canham, Light Emission from Silicon: Progress Towards Si-Based Optoelectronics, Proceedings of the Symposium B of the E-MRS 1998 Meeting (Elsevier, New York, 1999); J. Linnros, L. Pavesi, and V. Mulloni, Societa Italiana di Fisica, Proceedings of the ISP-Course CXLI, 87, (IOS, Amsterdam, 1999); P. M. Fauchet and Y. Kanemitsu, in Light Emission in Silicon, Semiconductors and Semimetals, edited by, D. J. Lockwood, (Academic, New York, 1997), Vol. 49.
4. U. Serincan, G. Kartopu, A. Guennes, T. G. Finstad, R. Turan, Y. Ekinci, and S. C. Bayliss, Semicond. Sci. Technol. SSTEET 0268-1242 10.1088/0268-1242/ 19/2/021 19, 247 (2004).
5. M. Fujii, S. Hayashii, and K. Yamamato, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.103802 57, 2692 (1990).
6. H. Gerung, Y. Zhao, L. Wang, R. K. Jain, T. J. Boyle, C. J. Brinker, and S. M. Han, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2352711 89, 111107 (2006).
7. K. M. Hassan, A. K. Sharma, J. Narayan, J. F. Muth, C. W. Teng, and R. M. Kolbas, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.124648 75, 1222 (1999).
8. S. Hayashi, M. Ito, and H. Kanamori, Solid State Commun. SSCOA4 0038-1098 10.1016/0038-1098(82)90717-7 44, 75 (1982).
9. M. V. Wolkin, J. Jorne, P. M. Fauchet, G. Allan, and C. Deleure, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.82.197 82, 197 (1999).
10. G. Dalba, N. Daldosso, P. Fornasini, R. Grisenti, L. Pavesi, F. Rocca, G. Franzo, F. Priolo, and F. Iacona, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1543641 82, 889 (2003).
11. S. Okamoto and Y. Kanemitsu, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.54.16421 54, 16421 (1996).
12. D. Gerion, N. Zaitseva, C. Saw, M. C. Casula, S. Fakra, T. Van Buuren, and G. Galli, Nano Lett. NALEFD 1530-6984 10.1021/nl035231t 4, 597 (2004).
13. S. -S. Chang and R. E. Hummel, J. Lumin. JLUMA8 0022-2313 10.1016/S0022-2313(99)00179-9 86, 33 (2000).
14. J. Shieh, H. L. Chen, T. S. Ko, H. C. Cheng, and T. C. Chu, Adv. Mater. (Weinheim, Ger.) 16, 1121 (2004) 0935-9648; T. S. Ko, J. Shieh, M. C. Yang, T. C. Lu, H. C. Kuo, and S. C. Wang, Thin Solid Films THSFAP 0040-6090 10.1016/j.tsf.2007.06.023 516, 2934 (2007).
15. E. B. Kaganovich, S. I. Kirillova, E. G. Manoilov, V. E. Primachenko, S. V. Svechnikov, E. F. Venger, and I. R. Bazylyuk, Semicond. Phys., Quantum Electron. Optoelectron. SPQEAN 5, 125 (2002); D. Mills and K. W. Kolasinski, J. Phys. D JPAPBE 0022-3727 10.1088/0022-3727/38/4/017 38, 632 (2005).
16. G. Kartopu, S. C. Bayliss, R. E. Hummel, and Y. Ekinci, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1650919 95, 3466 (2004).
17. G. Kartopu, V. A. Karavanskii, U. Serincan, R. Turan, R. E. Hummel, Y. Ekinci, A. Gunns, and T. G. Finstad, Phys. Status Solidi A PSSABA 0031-8965 10.1002/pssa.200461140 202, 1472 (2005).
18. S. Miyazaki, K. Sakamoto, K. Shiba, and M. Hirose, Thin Solid Films THSFAP 0040-6090 99, 255 (1995).
19. P. J. Harris, Ph.D. thesis, De Montfort University, Leicester, 1996; S. Bayliss, Q. Zhang, and P. Harris, Appl. Surf. Sci. 102, 390 (1996). 0169-4332
20. H. C. Choi and J. M. Buriak, Chem. Commun. (Cambridge) CHCOFS 1359-7345 2000, 1669.
21. S. Langa, M. Christophersen, J. Carstensen, I. M. Tiginyanu, and H. Föll, Phys. Status Solidi A PSSABA 0031-8965 10.1002/pssa.200306456 195, R4 (2003); C. Fang, H. Föll, J. Carstensen, and S. Langa, Phys. Status Solidi A PSSABA 0031-8965 10.1002/pssa.200674312 204, 1292 (2007).
22. G. Flamand, J. Poortmans, and K. Dessein, Phys. Status Solidi C 2, 3243 (2005). 0031-8957
23. M. Sendova-Vassileva, N. Tzenov, D. Dimova-Malinovska, M. Rosenbauer, M. Stutzmann, and K. V. Josepovits, Thin Solid Films THSFAP 0040-6090 10.1016/0040-6090(94)05673-2 255, 282 (1995).
24. D. Dimova-Malinovska, N. Tzenov, and M. Tzolov, Bulg. J. Phys. 21, 80 (1994). 1742-6588
25. V. A. Karavanskii, A. A. Lomov, A. G. Sutyrin, V. A. Bushuev, N. N. Loikho, N. N. Melnik, T. N. Zavaritskaya, and S. Bayliss, Phys. Status Solidi A 197, 144 (2003). 0031-8957
26. G. Kartopu, S. C. Bayliss, V. A. Karavanskii, R. J. Curry, R. Turan, and A. V. Sapelkin, J. Lumin. JLUMA8 0022-2313 10.1016/S0022-2313(02)00570-7 101, 275 (2003).
27. A. V. Sapelkin, V. A. Karavanskii, G. Kartopu, M. Es-Souni, and Z. Luklinska, Phys. Status Solidi B PSSBBD 0370-1972 10.1002/pssb.200642432 244, 1376 (2007).
28. W. Lang, R. Leancu, U. Schaber, G. Wiedemann, and H. U. Käufl, J. Micromech. Microeng. JMMIEZ 0960-1317 10.1088/0960-1317/6/1/008 6, 46 (1996).
29. L. T. Canham, A. G. Cullis, C. Pickering, O. D. Dosser, T. I. Cox, and T. P. Lynch, Nature (London) NATUAS 0028-0836 10.1038/368133a0 368, 133 (1994).
30. P. M. Fauchet and I. H. Campbell, Crit. Rev. Solid State Mater. Sci. 14, 79 (1988) 1040-8436; D. R. dos Santos and I. L. Torriani, Solid State Commun. SSCOA4 0038-1098 10.1016/0038-1098(93)90021-E 85, 307 (1993).
31. M. I. Vasilevskiy, A. G. Rolo, M. J. M. Gomes, O. V. Vikhrova, and C. Ricolleau, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/13/14/ 320 13, 3491 (2001).
32. Y. Sasaki and C. Horie, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.47.3811 47, 3811 (1993).
33. S. C. Shen, C. J. Fang, M. Cardona, and L. Grenzel, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.22.2913 22, 2913 (1980).
34. S. Hayashi, K. Yamamoto, and H. Kanamori, Superlattices Microstruct. SUMIEK 0749-6036 10.1006/spmi.1996.0444 2, 581 (1986).
35. I. D. Sharp, Q. Xu, C. Y. Liao, D. O. Yi, J. W. Beeman, Z. Liliental-Weber, K. M. Yu, D. N. Zakharov, J. W. Ager III, D. C. Chrzan, and E. E. Haller, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1942629 97, 124316 (2005).
36. G. Mariotto, F. Ziglio, and F. L. Freire, Jr., J. Non-Cryst. Solids 192-193, 253 (1995) 0022-3093; D. Papadimitriou, J. Bitsakis, J. M. Lopez-Villegas, J. Samitier, and J. R. Morante, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(99)00213-8 349, 293 (1999).
37. A. G. Rolo, M. I. Vasilevsky, O. Conde, and M. J. M. Gomes, Thin Solid Films THSFAP 0040-6090 10.1016/S0040-6090(98)01298-X 336, 58 (1998).
38. K. L. Teo, S. K. Kwok, P. Y. Yu, and S. Guha, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.62.1584 62, 1584 (2000).
39. G. Nesher, L. Kronik, and J. R. Chelikowsky, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.71.035344 71, 035344 (2005).