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Volumn 19, Issue 2, 2004, Pages 247-251
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Characterization of Ge nanocrystals embedded in SiO2 by Raman spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
GERMANIUM NANOCRYSTALS;
PHONON CONFINEMENT MODEL;
RAMAN SHIFT;
ANNEALING;
CRYSTAL SYMMETRY;
IMAGE ANALYSIS;
ION IMPLANTATION;
MATHEMATICAL MODELS;
NANOSTRUCTURED MATERIALS;
PHONONS;
RAMAN SPECTROSCOPY;
SILICA;
TRANSMISSION ELECTRON MICROSCOPY;
SEMICONDUCTING GERMANIUM;
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EID: 1342263695
PISSN: 02681242
EISSN: None
Source Type: Journal
DOI: 10.1088/0268-1242/19/2/021 Document Type: Article |
Times cited : (65)
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References (23)
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