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Volumn 19, Issue 2, 2004, Pages 247-251

Characterization of Ge nanocrystals embedded in SiO2 by Raman spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM NANOCRYSTALS; PHONON CONFINEMENT MODEL; RAMAN SHIFT;

EID: 1342263695     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/19/2/021     Document Type: Article
Times cited : (65)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.