|
Volumn 102, Issue , 1996, Pages 390-394
|
Network dimensionality of porous Si and Ge
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ANODIC OXIDATION;
CRYSTAL MICROSTRUCTURE;
CRYSTALLINE MATERIALS;
EMISSION SPECTROSCOPY;
ETCHING;
PHOTOEMISSION;
POROUS SILICON;
SEMICONDUCTING GERMANIUM;
SURFACE ROUGHNESS;
X RAY ANALYSIS;
CARRIER CONFINEMENT;
NANOCORES;
NANOWIRES;
POROUS GERMANIUM;
QUANTUM CONFINEMENT;
NANOSTRUCTURED MATERIALS;
|
EID: 0030564855
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/0169-4332(96)00084-0 Document Type: Article |
Times cited : (27)
|
References (22)
|