A guide to accurate measurement of diffusion using fluorescence correlation techniques with blinking quantum dot nanoparticle labels

Journal of Chemical Physics

Volumn 128, Issue 22, 2008, Pages

  Bachir, Alexia I ^a   Kolin, David L ^a   Heinze, Katrin G ^b   Hebert, Benedict ^a   Wiseman, Paul W ^a  

^a MCGILL UNIVERSITY   (Canada)

^b RESEARCH INSTITUTE OF MOLECULAR PATHOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; CORRELATION METHODS; DIFFUSION; DISTRIBUTION FUNCTIONS; DYNAMICS; EMISSION SPECTROSCOPY; ERROR STATISTICS; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; LIGHT EMISSION; LUMINESCENCE; MATHEMATICAL MODELS; MEASUREMENTS; MECHANICS; MODAL ANALYSIS; MOLECULAR BIOLOGY; NUMERICAL METHODS; OPTICAL WAVEGUIDES; PROBABILITY DISTRIBUTIONS; QUANTUM ELECTRONICS; RECOVERY; REGRESSION ANALYSIS; RISK ASSESSMENT; SEMICONDUCTOR DOPING; SET THEORY; SPACE PROBES; SPECTRUM ANALYSIS; TIME SERIES ANALYSIS; TRANSPORT PROPERTIES;

(PL) PROPERTIES; ACCURATE MEASUREMENTS; AMERICAN INSTITUTE OF PHYSICS (AIP); BIOLOGICAL APPLICATIONS; BLINKING DYNAMICS; CORRELATION ANALYSIS; DIFFUSION COEFFICIENTS (D); DIFFUSION MODELING; DIFFUSION TIME; EMISSION CHARACTERISTICS; EXPERIMENTAL DATA; FLUORESCENCE BLINKING; FLUORESCENCE CORRELATION; FLUORESCENCE INTERMITTENCY; FLUORESCENT PROBING; FLUOROPHORE; IMAGE CORRELATION SPECTROSCOPY; K-SPACE; NANO PARTICLES; PHOTOSTABLE; POINT EMITTERS; POWER-LAW DISTRIBUTION (PLD); POWER-LAW STATISTICS; PROBABILITY DISTRIBUTION FUNCTION (PDF); QUANTITATIVE CORRELATION; QUANTUM DOT (CO); QUANTUM DOTS (QDS); RELATIVE ERROR (RE); SAMPLING RATE (SR); SIMULATED IMAGING; SYSTEMATIC (CO); TIME CORRELATIONS; TIME SCALING; TIME SERIES; TRANSPORT DYNAMICS; TRANSPORT MEASUREMENTS; TRANSPORT MODELLING; WIDE-RANGE;

SEMICONDUCTOR QUANTUM DOTS;

FLUORESCENT DYE; QUANTUM DOT;

ARTICLE; CHEMISTRY; DIFFUSION; FLUORESCENCE; SENSITIVITY AND SPECIFICITY; SPECTROSCOPY; STATISTICS; TIME;

DIFFUSION; FLUORESCENCE; FLUORESCENT DYES; QUANTUM DOTS; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS; STOCHASTIC PROCESSES; TIME FACTORS;

EID: 45149104574     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2918273     Document Type: Article

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