Total internal reflection fluorescence microscopy - A powerful tool to study single quantum dots

Applied Surface Science

Volumn 234, Issue 1-4, 2004, Pages 86-92

  Kobitski, A Yu ^a   Heyes, C D ^a   Nienhaus, G U ^a,b  

^a UNIVERSITY OF ULM   (Germany)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

Fluorescence intermittency; Quantum dots; Single particle spectroscopy; Total internal reflection fluorescence microscopy (TIRFM)

Indexed keywords

CRYSTALLINE MATERIALS; FLUORESCENCE; IONIZATION; LIGHT REFLECTION; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; SEMICONDUCTING CADMIUM COMPOUNDS;

FLUORESCENCE INTERMITTENCY; SINGLE PARTICLE SPECTROSCOPY; TOTAL INTERNAL REFLECTION FLUORESCENCE MICROSCOPY (TIRFM);

SEMICONDUCTOR QUANTUM DOTS;

EID: 3342978083     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.05.048     Document Type: Conference Paper

References (22)

1. Axelrod D., Thompson N.L., Burghardt T.P. J. Microsc. 129:1983;19-28.
2. Funatsu T., Harada Y., Tokunaga M., Saito K., Yanagida T. Nature. 374:1995;555-559.
3. Empedocles S.A., Norris D.J., Bawendi M.G. Phys. Rev. Lett. 77:1996;3873-3876.
4. Goehde W., Tittel J., Basche T., Braeuchle C., Fisher U.C., Fuchs H. Rev. Sci. Instrum. 68:1997;2246-2474.
5. Kuno M., Fromm D.P., Hamann H.F., Galagher A., Nesbitt D.J. J. Chem. Phys. 112:2000;3117-3120.
6. Michalet X., Pinaud F., Lacoste T.D., Dahan M., Bruchez M.P., Alivisatos A.P., Weiss S. Single Mol. 2:2001;261-276.
7. Murray C.B., Sun S., Gaschler W., Doyle H., Betley T.A., Kagan C.R. IBM J. Res. Dev. 45:2001;47-56.
8. Empedocles S.A., Neuhauser R.G., Shimizu K.T., Bawendi M.G. Adv. Mater. 11:1999;1243-1256.
9. Dabbousi B.O., Rodriguez-Viejo J., Mikulec F.V., Heine J.R., Mattoussi H., Ober R., Jensen K.F., Bawendi M.G. J. Phys. Chem. B. 101:1997;9463-9475.
10. K.T. Shimizu, R.G. Neuhauser, C.A. Leatherdale, S.A. Empedocles, W.K. Woo, M.G. Bawendi, Phys. Rev. B 63 (2001) 205316.
11. Kuno M., Fromm D.P., Hamann H.F., Galagher A., Nesbitt D.J. J. Chem. Phys. 115:2001;1028-1040.
12. M. Kuno, D.P. Fromm, S.T. Johnson, A. Galagher, D.J. Nesbitt, Phys. Rev. B 67 (2003) 125304.
13. Neuhauser R.G., Shimizu K.T., Woo W.K., Empedocles S.A., Bawendi M.G. Phys. Rev. Lett. 85:2000;3301-3304.
14. Murray C.B., Norris D.J., Bawendi M.G. J. Am. Chem. Soc. 115:1993;8706-8715.
15. Peng Z.A., Peng X. J. Am. Chem. Soc. 123:2001;183-184.
16. Talapin D.V., Rogach A.L., Kornowski A., Haase M., Weller H. Nano Lett. 1:2001;204-211.
17. Peng X., Wickham J., Alivisatos A.P. J. Am. Chem. Soc. 120:1998;5343-5344.
18. Efros A.L., Rosen M. Phys. Rev. Lett. 78:1997;1110-1113.
19. R. Verberk, A.M. Van Oijen, M. Orrit, Phys. Rev. B 66 (2002) 233202.
20. Verberk R., Orrit M. J. Chem. Phys. 119:2003;2214-2222.
21. Lindsey C.P., Patterson G.D. J. Chem. Phys. 73:1980;3348-3357.
22. Messin G., Hermier J.P., Giacobino E., Desbiolles P., Dahan M. Opt. Lett. 26:2001;1891-1893.