|
Volumn 85, Issue 5, 2004, Pages 819-821
|
Characterizing quantum-dot blinking using noise power spectra
|
Author keywords
[No Author keywords available]
|
Indexed keywords
MACROSCOPIC ENSEMBLES;
ROOM TEMPERATURE (RT);
SILICON PHOTODIODES;
TRIOCTYL PHOSPHINE OXIDES (TOPO);
CHARGE COUPLED DEVICES;
COLLOIDS;
CORRELATION METHODS;
DIGITAL SIGNAL PROCESSING;
FLUORESCENCE;
FOURIER TRANSFORMS;
FUNCTIONS;
LASERS;
LIGHT EMITTING DIODES;
MICROSCOPIC EXAMINATION;
PHOTODIODES;
POLYSTYRENES;
PROBABILITY DISTRIBUTIONS;
SPURIOUS SIGNAL NOISE;
STATISTICS;
THEOREM PROVING;
SEMICONDUCTOR QUANTUM DOTS;
|
EID: 4344590032
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1779356 Document Type: Article |
Times cited : (118)
|
References (15)
|