DNA adsorption at functionalized Si/buffer interfaces studied by x-ray reflectivity

Journal of Chemical Physics

Volumn 128, Issue 22, 2008, Pages

  Douarche, C ^a,b,c   Corts R ^a   Henry De Villeneuve, C ^a   Roser, S J ^d   Braslau, A ^e  

^a LABORATOIRE DE PHYSIQUE DE LA MATIÈRE CONDENSÉE   (France)

^b CEA SACLAY   (France)

^c CNRS   (France)

^d University of Bath   (United Kingdom)

^e DIF   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; DEFORMATION; DNA; ELECTRON ENERGY LEVELS; GENES; LEAD; LITHOGRAPHY; METAL CLADDING; MOLECULAR STRUCTURE; MOLECULES; MONOLAYERS; NUCLEIC ACIDS; ORGANIC ACIDS; REFLECTION; SILICON; SPECTROSCOPIC ANALYSIS; SURFACE PROPERTIES; SURFACES; X RAY ANALYSIS; X RAY DIFFRACTION; X RAYS;

(1 1 0) SURFACE; ADDITIONAL MASS; ADSORBED LAYERS; ALKYL CHAINS; AMERICAN INSTITUTE OF PHYSICS (AIP); COVALENTLY BONDED; DENSITY PROFILES; DOUBLE-STRANDED DNA (DS-DNA); FUNCTIONALIZED; INFRARED (IR); MOLECULAR MONOLAYERS; MONO DISPERSED; PARTIAL EMBEDDING; POSITIVELY CHARGED; QUANTITATIVE CHARACTERIZATION; SALT CONCENTRATIONS; SINGLE CRYSTAL SILICON (SCS); SINGLE STRANDED DNA (SS DNA); SOFT SURFACES; SPECTROSCOPIC MEASUREMENTS; SURFACE DENSITIES; X RAY REFLECTIVITY (SXR); YIELD SURFACES;

SINGLE CRYSTAL SURFACES;

AMINE; BUFFER; DNA; SILICON; SINGLE STRANDED DNA;

ADSORPTION; ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; GENETICS; MOLECULAR GENETICS; NUCLEOTIDE SEQUENCE; REPRODUCIBILITY; SURFACE PROPERTY; X RAY;

ADSORPTION; AMINES; BASE SEQUENCE; BUFFERS; DNA; DNA, SINGLE-STRANDED; MODELS, MOLECULAR; MOLECULAR SEQUENCE DATA; REPRODUCIBILITY OF RESULTS; SILICON; SURFACE PROPERTIES; X-RAYS;

EID: 45149092914     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2927256     Document Type: Article

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