650 nm tapered lasers with 1 W maximum output power and nearly diffraction limited beam quality at 500 mW

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6876, Issue , 2008, Pages

  Sumpf, B ^a   Adamiec, P ^a   Zorn, M ^a   Froese, P ^a   Fricke, J ^a   Ressel, P ^a   Wenzel, H ^a   Weyers, M ^a   Erbert, G ^a   Trankle G ^a  

^a LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

Author keywords

Diffraction limited; High power diode lasers; Red lasers; Reliability; Tapered lasers

Indexed keywords

ALGAINP; BEAM PROPAGATION RATIO; CLADDING LAYERS; CW OPERATION; DIFFRACTION LIMITED; HIGH POWERS; HIGH-BRIGHTNESS (HB); MAXIMUM OUTPUT POWER; MW OUTPUT; OPERATING CURRENTS; OUTPUT POWERS; RELIABILITY TESTING; RIDGE WAVEGUIDE (RWG); SINGLE QUANTUM WELL (SQW); TAPER ANGLES; TAPERED LASERS; TAPERED STRUCTURES; VERTICAL STRUCTURES; WAVEGUIDE LAYERS;

BEAM QUALITY; CLADDING (COATING); COMPUTER NETWORKS; DIFFRACTION; DIODES; ELECTRIC POWER GENERATION; FIBER LASERS; LASERS; MICROFLUIDICS; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; QUANTUM WELL LASERS; SEMICONDUCTOR QUANTUM WELLS; TECHNOLOGY; TESTING; VEGETATION; WAVEGUIDES;

POWER QUALITY;

EID: 44949115990     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.761575     Document Type: Conference Paper

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