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Volumn 6485, Issue , 2007, Pages

670 nm tapered lasers and amplifiers with output powers P ≥ 1 W and nearly diffraction limited beam quality

Author keywords

Diffraction limited; High power diode lasers; MOPA; Red lasers; Tapered amplifiers; Tapered lasers

Indexed keywords

DIFFRACTION LIMITED BEAM QUALITY; HIGH POWER DIODE LASERS; MASTER OSCILLATOR POWER AMPLIFIERS (MOPA); RED LASERS; TAPERED AMPLIFIERS; TAPERED LASERS;

EID: 34248635145     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.697935     Document Type: Conference Paper
Times cited : (18)

References (13)
  • 4
    • 41549115560 scopus 로고    scopus 로고
    • 3 W - broad area lasers and 12 W - bars with conversion efficiencies up to 40% at 650 nm Conference Digest 2006 IEEE 20th International Semiconductor Laser Conference, pp. 37-38; IEEE Catalog Number: 06CH37738C; ISBN Number: 0-7803-9560-3
    • B. Sumpf, M. Zorn, R. Staske, J. Fricke, P. Ressel, A. Ginolas, K. Paschke, G. Erbert, M. Weyers, G. Tränkle "3 W - broad area lasers and 12 W - bars with conversion efficiencies up to 40% at 650 nm" Conference Digest 2006 IEEE 20th International Semiconductor Laser Conference, pp. 37-38; IEEE Catalog Number: 06CH37738C; ISBN Number: 0-7803-9560-3; Library of Congress: 2005934158
    • Library of Congress , pp. 2005934158
    • Sumpf, B.1    Zorn, M.2    Staske, R.3    Fricke, J.4    Ressel, P.5    Ginolas, A.6    Paschke, K.7    Erbert, G.8    Weyers, M.9    Tränkle, G.10
  • 5
    • 0033736986 scopus 로고    scopus 로고
    • B. Pezeshki, M. Hagberg, B. Lu, M. Zeleinski, S. Zou, E. Kolev High Power and Diffraction-Limited Red Lasers In-Plane Semiconductor Lasers IV, Editors: L. J. Mawst, R. U. Martinelli; Proceedings of SPIE 3947; 80-90 (2000)
    • B. Pezeshki, M. Hagberg, B. Lu, M. Zeleinski, S. Zou, E. Kolev "High Power and Diffraction-Limited Red Lasers" In-Plane Semiconductor Lasers IV, Editors: L. J. Mawst, R. U. Martinelli; Proceedings of SPIE Vol. 3947; 80-90 (2000)
  • 7
    • 0141816617 scopus 로고    scopus 로고
    • 147,149Sm Measured Using Saturated Absorption Spectroscopy in Combination with Resonacnce-Ionization Mass Spectroscopy
    • 147,149Sm Measured Using Saturated Absorption Spectroscopy in Combination with Resonacnce-Ionization Mass Spectroscopy" Journal of the Korean Physical Society, 43, 336-341 (2003)
    • (2003) Journal of the Korean Physical Society , vol.43 , pp. 336-341
    • Park, H.1    Lee, M.2    Rhee, Y.3
  • 13
    • 34248630836 scopus 로고    scopus 로고
    • R. Häring, B. Sumpf, G. Erbert, G. Tränkle, F. Lison, W. G. Kaenders 670 nm semiconductor lasers for Lithium Spectroscopy with 1 W Proceedings of SPIE, Photonics West 2007
    • R. Häring, B. Sumpf, G. Erbert, G. Tränkle, F. Lison, W. G. Kaenders "670 nm semiconductor lasers for Lithium Spectroscopy with 1 W Proceedings of SPIE, Photonics West 2007


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.