Highly reliable 60 °C 50-mW operation of 650-nm band window-mirror laser diodes

IEEE Photonics Technology Letters

Volumn 9, Issue 4, 1997, Pages 413-415

  Shima, A ^a,b   Tada, H ^a   Ono, K ^a   Fujiwara, M ^a   Utakouji, T ^a   Kimura, T ^a   Takemi, M ^a   Higuchi, H ^a  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

^b IEEE   (Japan)

Author keywords

CW lasers; Diffusion processes; Disk recording; Reliability; Semiconductor lasers

Indexed keywords

BAND STRUCTURE; CONTINUOUS WAVE LASERS; DIFFUSION; DIGITAL STORAGE; FABRICATION; HETEROJUNCTIONS; HIGH TEMPERATURE EFFECTS; MIRRORS; RECORDING; RELIABILITY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM WELLS;

DIGITAL VERSATILE DISK; DISK RECORDING;

SEMICONDUCTOR LASERS;

EID: 0031120130     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.559372     Document Type: Article

References (9)

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