Measurement and Modeling Errors in Noise Parameters of Scaled-CMOS Devices

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 6, 2006, Pages 2336-2345

  Banerjee, Gaurab ^a,b   Sournyanath, K ^a   Allstot, David J ^c  

^a INTEL CORPORATION   (United States)

^b University of Washington   (United States)

^c UNIVERSITY OF WASHINGTON   (United States)

Author keywords

CMOS; desensitization; errors; low noise amplifier (LNA); measurements; modeling; noise figure; noise parameters; scaling

Indexed keywords

EID: 44449142262     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/TMTT.2006.875269     Document Type: Article

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