A new lossy substrate de-embedding method for sub-100 nm RF CMOS noise extraction and modeling

IEEE Transactions on Electron Devices

Volumn 53, Issue 2, 2006, Pages 339-347

  Guo, Jyh Chyurn ^a   Lin, Yi Min ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

De embedding; Noise; Pad; RF CMOS; Substrate

Indexed keywords

ELECTRIC NETWORK ANALYSIS; EQUIVALENT CIRCUITS; MOS DEVICES; MOSFET DEVICES; SPURIOUS SIGNAL NOISE; SUBSTRATES;

DE-EMBEDDING METHOD; LOSSY PAD EFFECT; NOISE EXTRACTION;

CMOS INTEGRATED CIRCUITS;

EID: 31744434477     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2005.862699     Document Type: Article

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