A wide-band on-wafer noise parameter measurement system at 50-75 GHz

IEEE Transactions on Microwave Theory and Techniques

Volumn 51, Issue 5, 2003, Pages 1489-1495

  Kantanen, Mikko ^a   Lahdes, Manu ^a   Vähä Heikkilä, Tauno ^a   Tuovinen, Jussi ^a  

^a VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

Noise parameter measurements; On wafer characterization; Wide band measurements

Indexed keywords

ELECTRON MOBILITY; MONTE CARLO METHODS; SPURIOUS SIGNAL NOISE; TRANSISTORS; WAVEGUIDES;

ON-WAFER NOISE PARAMETERS;

MILLIMETER WAVES;

EID: 0037718464     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2003.810129     Document Type: Article

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