Snowplow effect and reactive diffusion in the Pt doped Ni-Si system

Scripta Materialia

Volumn 57, Issue 5, 2007, Pages 373-376

  Cojocaru Miredin O ^a   Mangelinck, D ^b   Hoummada, K ^b   Cadel, E ^a   Blavette, D ^a   Deconihout, B ^a   Perrin Pellegrino, C ^b  

^a UNIVERSITÉ DE ROUEN   (France)

^b AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Atom probe field ion microscopy; Interface migration; Interface segregation; Thin films; Transition metal silicides

Indexed keywords

DIFFUSION; DOPING (ADDITIVES); HEAT TREATMENT; PLATINUM; SILICIDES; SNOW PLOWS; THIN FILMS; ULTRASHORT PULSES;

ATOM PROBE FIELD ION MICROSCOPY; INTERFACE MIGRATION; INTERFACE SEGREGATION; TRANSITION METAL SILICIDES;

NICKEL COMPOUNDS;

EID: 34250191784     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2007.05.007     Document Type: Article

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