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Volumn 16, Issue 33, 2004, Pages
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Studies of NO on 4H-SiC(0001) using synchrotron radiation
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Author keywords
[No Author keywords available]
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Indexed keywords
DRY OXIDATION;
ELECTRON ANALYZER;
NITROGEN CONTAINING GAS;
CHEMICAL BONDS;
DENSITY (SPECIFIC GRAVITY);
INTERFACES (MATERIALS);
NITROGEN OXIDES;
SILICON CARBIDE;
SUBSTRATES;
SYNCHROTRON RADIATION;
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EID: 4444350485
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/16/33/003 Document Type: Conference Paper |
Times cited : (6)
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References (14)
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