SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 660, Issue , 2001, Pages

Electrical instabilities and 1/f noise in organic pentacene thin film transistors

(4) Necliudov, P V a Shur, M a Gundlach, D J a Jackson, T N a

a RENSSELAER POLYTECHNIC INSTITUTE (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SPURIOUS SIGNAL NOISE; STABILITY; THERMAL STRESS; THRESHOLD VOLTAGE;

BIAS TEMPERATURE STRESS; ELECTRIC INSTABILITIES; ORGANIC PENTACENE THIN FILM TRANSISTORS;

THIN FILM TRANSISTORS;

EID: 0035558563 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (12)

References (11)

1
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- (1999) 57th Device Research Conference Digest , pp. 164-165
- Gundlach, D.J.¹ Kuo, C.C.² Nelson, S.F.³ Jackson, T.N.⁴

2
- 0343081409
- (2000) Solid State Technology , vol.43 , pp. 63-77
- Klauk, H.¹ Gundlach, D.J.² Nichols, J.A.³ Sheraw, C.D.⁴ Bonse, M.⁵ Jackson, T.N.⁶

3
- 0032257708
- (1998) 1998 International Electron Devices Meeting Technical Digest , pp. 249-252
- Bonse, M.¹ Thomasson, D.B.² Klauk, H.³ Gundlach, D.J.⁴ Jackson, T.N.⁵

4
- 0034275931
- (2000) Sensors and Actuators B (Chemical) , vol.B67 , pp. 312-316
- Torsi, L.¹ Dodabalapur, A.² Sabbatini, L.³ Zambonin, P.G.⁴

5
- 0000034599
- (1997) IEEE Transaction on Electron Devices , vol.8 , pp. 320-325
- Lin, Y.Y.¹ Gundlach, D.J.² Nelson, S.F.³ Jackson, T.N.⁴

6
- 0031673411
- (1998) IEEE Journal of Selected Topics in Quantum Electronics , vol.4 , pp. 100-104
- Jackson, T.N.¹ Lin, Y.Y.² Gundlach, D.J.³ Klauk, H.⁴

7
- 0005983930
- (1999) ISDRS 1999 Proceedings , pp. 373-376
- Necliudov, P.V.¹ Shur, M.S.² Gundlach, D.J.³ Jackson, T.N.⁴

8
- 0005950311
- (August)
- (2000) Journal of Applied Physics
- Necliudov, P.V.¹ Shur, M.S.² Gundlach, D.J.³ Jackson, T.N.⁴

9
- 0002394970
- (1999) 41st Electronic Materials Conference Digest , pp. 16
- Wang, J.¹ Gundlach, D.J.² Kuo, C.C.³ Jackson, T.N.⁴

10
- 0032154561
- (1998) Jpn. J. Appl. Phys. , vol.37 , pp. 4704-4710
- Chiang, C.¹ Kanicki, J.² Takechi, K.³

11
- 0001417034
- (2000) Journal of Applied Physics , vol.88 , pp. 5395-5399
- Necliudov, P.V.¹ Shur, M.S.² Rumyantsev, S.³ Gundlach, D.J.⁴ Jackson, T.N.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.