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Volumn 43, Issue 6 B, 2004, Pages 3941-3944
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Shrinking of spin-on-glass films induced by synchrotron radiation and its application to three-dimensional microfabrications
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Author keywords
Atomic force microscopy; Cure; Etching process; Fourier transform infrared spectroscopy; Scanning electron microscopy; Silicon oxides; Spin on glass; Synchrotron radiation
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Indexed keywords
ELECTRON BEAM CURING;
PRE-ANNEALING;
SPIN-ON-GLASS FILMS;
VOLUME RATIO;
ATOMIC FORCE MICROSCOPY;
ATTENUATION;
ETCHING;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MASKS;
PHOTONS;
SHRINKAGE;
SYNCHROTRON RADIATION;
THIN FILMS;
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EID: 4444237680
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/JJAP.43.3941 Document Type: Conference Paper |
Times cited : (8)
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References (16)
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