Low-frequency noise in structures with porous silicon in different gas media

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 4, Issue 6, 2007, Pages 2063-2067

  Mkhitaryan, Z H ^a   Shatveryan, A A ^a   Aroutiounian, V M ^a   Ghulinyan, M ^b   Pavesi, L ^b  

^a YEREVAN STATE UNIVERSITY   (Armenia)

^b UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE GASES; APPLIED SURFACE; CRYSTALLINE SILICONS; CURRENT-VOLTAGE; GAS MEDIUM; LOW-FREQUENCY NOISE; NOISE CHARACTERISTICS; NOISE PROPERTIES; POROUS SILICON STRUCTURES;

ADSORPTION; CEMENTS; CHARGE CARRIERS; CRYSTALLINE MATERIALS; GAS ADSORPTION; GASES; NONMETALS; POROUS SILICON; SILICON; SURFACE ANALYSIS; THERMAL NOISE;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 44349103985     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200674372     Document Type: Conference Paper

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