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Volumn 103, Issue 9, 2008, Pages

Amorphous versus crystalline state for ultrathin Al2 O 3 overgrowths on Al substrates

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; CRYSTALLINE MATERIALS; ELECTRON DIFFRACTION; THERMODYNAMICS; THERMOOXIDATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 43949083415     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2913505     Document Type: Article
Times cited : (79)

References (30)
  • 10
    • 43949138429 scopus 로고    scopus 로고
    • JCPDS-International Centre for Diffraction Data Card No. 00-004-0787 (Al); JCPDS-International Centre for Diffraction Data 00-050-0741 (γ- Al2 O3), 2007.
    • JCPDS-International Centre for Diffraction Data Card No. 00-004-0787 (Al) 2007; JCPDS-International Centre for Diffraction Data 00-050-0741 (γ- Al2 O3), 2007.
    • (2007)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.