Quantitative analysis of angle-resolved XPS spectra recorded in parallel data acquisition mode

Surface and Interface Analysis

Volumn 36, Issue 13, 2004, Pages 1629-1636

  Vinodh, M S ^a   Jeurgens, L P H ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Angle resolved XPS; Anisotropy of photoionization; Asymmetry parameter; Elastic scattering; Parallel data acquisition; Quantitative analysis

Indexed keywords

ALUMINA; ANISOTROPY; CHEMICAL ANALYSIS; DATA ACQUISITION; ELECTROMAGNETIC WAVE SCATTERING; THERMOGRAVIMETRIC ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE-RESOLVED XPS; ASYMMETRY PARAMETER; ELASTIC SCATTERING; PARALLEL DATA ACQUISITION;

PHOTOIONIZATION;

EID: 11144339575     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.2000     Document Type: Article

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