The origin of high-mismatch orientation relationships for ultra-thin oxide overgrowths

Acta Materialia

Volumn 55, Issue 17, 2007, Pages 6027-6037

  Reichel, F ^a   Jeurgens, L P H ^a   Richter, G ^a   van Aken, P A ^a   Mittemeijer, E J ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Crystallographic orientation relationship; High resolution transmission electron microscopy (HR TEM); Oxidation; Thermodynamics; Thin films

Indexed keywords

CHEMICAL BONDS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACIAL ENERGY; OXIDATION; STRAIN; THIN FILMS;

LARGE ENERGY CONTRIBUTIONS; LOW SURFACE ENERGY; ULTRA THIN OXIDE;

LATTICE MISMATCH;

EID: 34548681623     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2007.07.011     Document Type: Article

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